Showing results: 121 - 135 of 270 items found.
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ABex -
Konrad Technologies GmbH
The ABex (Analog Bus Extension for PXI) is an exceptional test platform that extends to accelerate productivity, development throughput and time to market. Applicable in various industries and technological fields, this platform covers complex test challenges anywhere on the production line.Due to its flexible system architecture with an analog bus backplane and terminal modules, the platform allows the integration of technology specific extensions and extremely short system set up times which result in a reduction of total system costs.
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Rohde & Schwarz GmbH & Co. KG
Rohde & Schwarz provides automotive manufacturers, components suppliers and test houses with innovative, cutting-edge solutions which bring realistic test scenarios from the road to the lab and production line.Our range of solutions include a signal generator-based target simulator, a radome & bumper tester and an anechoic automotive radar test chamber allowing for over-the-air (OTA) testing. These solutions are at the heart of the development of advanced driver assistance systems (ADAS) with its safety-critical features such as emergency braking. Using T&M solutions by Rohde & Schwarz enables a thorough testing of chipsets, sensors and modules at each phase from development and conformance to production.
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INDEC -
KoCoS Messtechnik AG
INDEC vacuum test systems monitor a wide range of containers during the production process, including bottles, jars and cans, by measuring the cap panel concavity of their closures which is dependent on the vacuum inside. This non-contact inspection reliably identifies defective containers for automatic rejection.
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N3600 Series -
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N3600 series is developed based on NGI's years of experience in testing for battery fluctuation simulation test, battery charger, high voltage diode, electrolytic capacitor, electromechanical control, ATE test system, etc. It is a high-voltage wide-range programmable DC power supply. According to different test environments in the fields of lab test, system integration test, and mass production line, NGI has made a number of optimization designs based on the international advanced technology. N3600 series is a market leader in similar products in terms of reliability, maintainability and safety.
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Circuit Check, Inc.
Circuit Check’s drop-in base fixture and replaceable personalized plates are the ideal solution where production volumes are lower and the need to change from one fixture and test program to another occurs quickly. Interchangeable test fixture drop-ins enable the same test system to be quickly reconfigured with different tooling and probe patterns for different products. This maximizes equipment re-use, while minimizing the cost for each new test. With Circuit Check’s base fixture and drop-ins, the wiring and test electronics are not disturbed, thus ensuring configuration consistency each time the system is re-tooled.
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LS9923 -
Lisun Electronics Inc.
LS9923 programmable withstanding voltage & insulation test system is high-performance testing device special for AC&DC Withstanding Voltage and Insulation Resistance Test, It allows setting the output voltage. The warning value,testing time and some other parameters can be set in the screen.It with a variety of automatic test functions. The testing is quick and high accuracy which is not only applied in the production line but also in the develop research.
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IFXX -
FETservice, Inc
FETtest offers a variety of Interface options, which expand test capability and provide connection to other production line resources. These interfaces range in complexity from simple handler/prober interfaces to interfaces with user programmable external component connections, to capacitance measurement systems. Models are available to work with the full range of FETtest systems and Remote Stations.
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AVIOR Series -
MPI Photonics Automation
The MPI AVIOR series offers a broad lineup of high performance prober systems targeting the Optical Communications market. Our prober systems are available in Top emitting (TP), Flip chip (FP) emitting and Die/Package (DP) configurations to meet your specific test requirements. Whether it be R&D or mass production, MPI has a solution that will meet your needs for accurate and reliable measurements in conjunction with a reduced cost-of-test.
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Wuhan Sunma Technology Co., Ltd.
SunmaFiber Mobile & Wireless Testers are the most cost-effective test solution for those in wireless manufacturing test, service test and handset repair requiring a multi-technology platform. By quickly testing GSM, GPRS, EDGE, WCDMA (UMTS), 1xEV-DO and TD-SCDMA terminals, we provides the lowest total test cost per device and drastically reduces production downtime because one system can easily switch from one technology to another.
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C8000 -
Chroma Systems Solutions, Inc.
Power conversion testing is our core competency. Chroma’s engineering delivers cost-effective automated test system and software platforms to fit your Design Validation Testing (DVT) requirements in the lab or High Speed Functional Testing in the production line. Built into each system are Chroma’s years of expertise, precision instrumentation, pre-written test libraries, and local program management with global support. From power conversion to battery to electrical safety, our test systems will maximize your time, improve your validation process, and increase your throughput.
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SS1063 -
Sanshine Electronis Co., Ltd.
This (SS1061 / SS1062 / SS1063) LCZ Meters are a test system for passive components designed for the use in electronic inspection or production process for quality control. They meet any demanding requirement on production speed and precision, discrimination of qualified products from unqualified ones, as well as internal setup, storing and calling function for up to 10 instrument groups, so they Like as: transformer, inductor, resistor, capacitor, relay, motor, generator, eletric valve, contactor,cable,wire,etc.
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NEOSEM TECHNOLOGY INC
We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market. The integrated system with CMB (custom designed Motherboard), Thermal subsystem and Automation technologies provides a Turn-key Automated Test System which reduces Integration risks and time to Volume Production. Our Automated DIMM SLT (System Level Test) System is highly configurable to address our customers needs and environments constraints for Best Cost of Ownership, Best Performance and shortest Time to Yield.
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UTP 6010 RF -
NOFFZ Computer Technik GmbH
The UTP 6010 is one of our smallest test systems and therefore a cost-effective entry into our UTP tester series.The fast system is used to implement scalable functional test applications for a test item (single device under test) with multiple RF channels and mixed-signal test options. Depending on the adapter, the DUT can be tested at circuit board level (FKT) or when installed at the end of the line (EOL).Depending on the test item requirements, we configure the appropriate number of channels and integrate the necessary interfaces directly in the adapter or tester. The test speed, production volume and overall complexity of the UTP 6010 interfaces can be varied according to your requirements.
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Cohu, Inc.
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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XJQuad -
XJTAG Ltd.
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
